EVALUATION OF RELIABILITY OF RADIO-ELECTRONIC DEVICES WITH VARIABLE STRUCTURE

Authors

  • Ye. V. Ryzhov Hetman Petro Sahaidachnyi National Army Academy, Lviv, Ukraine
  • L. N. Sakovich Institute of Special Communication and Information Protection of KPI named after Igor Sikorsky, Kyiv, Ukraine
  • O. O. Puchkov KPI named after Igor Sikorsky, Kyiv, Ukraine
  • Ya. E. Nebesna KPI named after Igor Sikorsky, Kyiv, Ukraine

DOI:

https://doi.org/10.15588/1607-3274-2020-3-3

Keywords:

Radio-electronic devices with variable structure, rating of reliability indicators, mean time between failures, average recovery time.

Abstract

Context. Various radio electronic devices are being continuously developed and refined in order to improve the quality indicators according to the consumers’ requirements for their use in multiple operational modes, each with separate subsets of elements. Given fact is not taken into account when assessing the reliability indicators, which leads to a decrease in their value, and, as a consequence, to an increase in the products cost.

Objective. The purpose of the article is to improve the quantification accuracy of reliability values of electronic devices with variable structure by using a new model, which takes into account the operational time of individual subsets of elements of the object in its possible operational modes.

Method. The paper analyzes the structures of radio electronic devices and their influence on reliability using methods of set theory, probability theory, discrete search theory and metrology. This allows objective quantification of reliability indicators values depending on the conditions of the product use: operating time for failure, average recovery time and the readiness coefficient.

Results. An improved model of reliability of multiple mode objects with variable structure, which takes into account the features of structural design of the product, the features of its intended use (operating time in separate modes), and the influence of the quality of metrological support on the average recovery time has been obtained. This allows increasing the estimation of the real value of the complex indicator of reliability – readiness coefficient, and, as a consequence, reducing the value of the readiness coefficient.

Conclusions. The use of the proposed model of quantitative estimation of the reliability indicators’ values of radio electronic devices with variable structure can reduce the cost of products while providing the required values of failure time and the average recovery time by reducing the requirements for the reliability of the base elements. The results obtained should be used in the design of perspective radio electronic devices to justify the choice of element of the minimum cost base while meeting the required requirements for the reliability of the product as a whole. x`x

Author Biographies

Ye. V. Ryzhov, Hetman Petro Sahaidachnyi National Army Academy, Lviv

PhD, Head of the Research Laboratory of the Informational and Geoinformational Technologies at the Scientific Center

L. N. Sakovich, Institute of Special Communication and Information Protection of KPI named after Igor Sikorsky, Kyiv

PhD, Associate Professor, Assistant Professor of Special Department

O. O. Puchkov, KPI named after Igor Sikorsky, Kyiv

PhD, Professor, Head of the Institute of Special Communication and Information Protection

Ya. E. Nebesna, KPI named after Igor Sikorsky, Kyiv

Head of the Planning and Controlling Sector of the Educational Department of the Institute of Special Communication and Information Protection

References

Handbook of 217 PlusTM. Reliability Prediction Models. – USA: RIAC, 2006, 186 p. URL: https://books.google.com.ua/books?id=33rW29AytewC &pg=PA1&hl=ru&source=gbs_toc_r&cad=4#v=onepage &q&f=false.

Yamada S., Tamura Y. Software Reliability / S. Yamada, // In: OSS Reliability Measurement and Assessment. Springer Series in Reliability Engineering. – Cham: Springer. – 2016. – P. 1–13. DOI: https://doi.org/10.1007/978-3-319-31818-9_1.

Manzini R., Regattieri A., Pham H., Ferrari E. Reliability Evaluation and Reliability Prediction Models, Maintenance for Industrial Systems. London, Springer Series in Reliability Engineering, 2010, 187 p. DOI: https://doi.org/10.1007/978-1-84882-575-8_6.

Hao Sun, Cai Xiaoxia, Chen Hong Study on Parameter Evaluation System of Communication Network, Procedia Computer Science, 2017, Vol. 107, pp. 584– 589. DOI: https://doi.org/10.1016/j.procs.2017.03.139.

Rongxing Duan, Fan Jinghui Reliability Evaluation of Data Communication System Based on Dynamic Fault Tree under Epistemic Uncertainty, Mathematical Problems in Engineering, Vol. 2014, Article ID 674804, 9 p. DOI: https://doi.org/10.1155/2014/674804.

Qiao Ma., Guibo Yu, Lijun Cao, Jinhui Zhao, Bing Feng Decision-making model for ranking battlefield damaged equipment repairs based on multi-criteria, 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 15–18 July 2013, Emeishan, Sichuan. China, Proc. IEEE, 2013, Vol. II, pp. 1942–1944. DOI: http://dx.doi.org/10.1109/QR2MSE.2013.6625959.

Khandpur R. S. Troubleshooting Electronic Equipment: Includes Repair And Maintenance, Second Edition. New York, McGraw Hill Education (India) Private Limited, 2003, 422 p. URL: https://www.accessengineeringlibrary.com/content/book/ 9780070483576.

Jonathan Swingler. Reliability Characterisation of Electrical and Electronic Systems. Woodhead Publishing, 2015, 274 p. DOI: https://doi.org/10.1016/C2013-016487-2.

Military handbook: reliability prediction of electronic equipment, MIL-HDBK-217F, (02-Dec-1991), 150 р.

Kharchenko V.A. Problems of reliability of electronic components, Modern Electronic Materials, 2015, Vol. 1, Issue 3, P. 88–92. DOI: http://dx.doi.org/10.1016/j.moem.2016.03.002.

Villanueva Ignacio, L.ázaro Isidro, Anzurez Juan Reliability analysis of LED-based electronic devices, Procedia Engineering, 2012, Vol. 35. pp. 260–269. DOI: http://dx.doi.org/10.1016/j.proeng.2012.04.189.

Catelani M., Ciani L. Experimental tests and reliability assessment of electronic ballast system, Microelectronics Reliability, 2012, Vol. 52, Issues 9–10, pp. 1833–1836. DOI: http://dx.doi.org/10.1016/j.microrel.2012.06.077.

Yi Wan, Hailong Huang, Diganta Das, Michael Pecht Thermal reliability prediction and analysis for highdensity electronic systems based on the Markov process, Microelectronics Reliability, 2016, Vol. 56, pp. 182–188. DOI: https://doi.org/10.1016/j.microrel.2015.10.006.

Romanenko V. P., Sakovych L. N., Ryzhov Y. V., Gnatyuk S. E. , Rozum I. Y. Methodology of justification the type and evaluation of quality group search of defects in the repair radio-electronic means, Radio Electronics, Computer Science, Control, 2019, No. 1. pp. 18–28. DOI: https://doi.org/10.15588/1607-3274-2019-1-2.

Robert B. Ash. Basic Probability Theory. New York: Dover Publications, 2008, 352 p. URL: https://faculty.math.illinois.edu/~r-ash/BPT/BPT.pdf.

Kononov V., Ryzhov Ye., Sakovych L. Dependence of parameters of repair of military communication means on the quality of metrological support, Advanced Information Systems, 2018, Vol. 2, No. 1, pp. 91–95. DOI: https://doi.org/10.20998/2522-9052.2018.1.17.

RF-7850M-HH multiband handheld radio. Operation manual. Rochester, Publication number: 10515-04614200, 2014, 237 p.

Ryzhov Ye., Sakovych L., Vankevych P., Yakovlev M., Nastishin Yu. Optimization of requirements for measuring instruments at metrological service of communication tools, Measurement 123, 2018, pp. 19– 25. DOI: https://doi.org/10.1016/j.measurement.2018.03.055.

Herasimov S., Pavlii V., Tymoshchuk O., Yakovlev M. Yu., Khaustov D. Ye. , Ryzhov Ye., Sakovych L., Nastishin Yu. A. Testing Signals for Electronics: Criteria for Synthesis, Journal of Electronic Testing, 2019, Vol. 35, No. 3, pp. 349–357. DOI: https://doi.org/10.1007/s10836-019-05798-9.

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How to Cite

Ryzhov, Y. V., Sakovich, L. N., Puchkov, O. O., & Nebesna, Y. E. (2020). EVALUATION OF RELIABILITY OF RADIO-ELECTRONIC DEVICES WITH VARIABLE STRUCTURE. Radio Electronics, Computer Science, Control, (3), 31–41. https://doi.org/10.15588/1607-3274-2020-3-3

Issue

No. 3 (2020): Radio Electronics, Computer Science, Control

Section

Radio electronics and telecommunications

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Copyright (c) 2020 Ye. V. Ryzhov, L. N. Sakovich, O. O. Puchkov, Ya. E. Nebesna

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